TOKYO–(BUSINESS WIRE)–Mitsubishi Electric Corporation (TOKYO: 6503) announced today that it has, for the first time in the world, elucidated the effects of frequency dispersion caused by crystal defects in a gallium nitride (GaN) transistor, a high-frequency transistor fabricated by depositing a GaN epitaxial layer on a GaN substrate, and demonstrated that frequency dispersion can be significantly suppressed. This achievement makes it possible to consistently realize the inherently high perfo